Chen, Weiqiang; Zhang, Lingyi; Pattipati, Krishna K.; Bazzi, Ali M.; Joshi, Shailesh N.; Dede, Ercan M.
(Institute of Electrical and Electronics Engineers Inc., 2020)
This article proposes an unsupervised learning approach for fault prognosis of silicon carbide (SiC) mosfets. The proposed approach utilizes the changing trend of a device's voltage, current, temperature, and other device ...