AUB ScholarWorks
Search
AUB ScholarWorks Home
→
Faculty of Engineering and Architecture (FEA)
→
Search
JavaScript is disabled for your browser. Some features of this site may not work without it.
Search
Filters
Use filters to refine the search results.
Current Filters:
Title
Author
Subject
Date issued
Has File(s)
Filename
File description
Contains
Equals
ID
Not Contains
Not Equals
Not ID
Title
Author
Subject
Date issued
Has File(s)
Filename
File description
Contains
Equals
ID
Not Contains
Not Equals
Not ID
New Filters:
Title
Author
Subject
Date issued
Has File(s)
Filename
File description
Contains
Equals
ID
Not Contains
Not Equals
Not ID
Showing 10 out of a total of 11 results for community: Faculty of Engineering and Architecture (FEA).
(0.008 seconds)
Now showing items 1-10 of 11
1
2
Next Page
Sort Options:
Relevance
Title Asc
Title Desc
Issue Date Asc
Issue Date Desc
Results Per Page:
5
10
20
40
60
80
100
Low-power digital signal processor design for a hearing aid
Shaer L.
;
Nahlus I.
;
Merhi J.
;
Kayssi A.
;
Chehab A.
(
2013
)
Transient current testing for future CMOS technologies
Rjeily M.A.
;
Chehab A.
;
Kayssi A.
(
2009
)
The effectiveness of delay and I DDT tests in detecting resistive open defects for nanometer CMOS adder circuits
Hamieh L.
;
Mehdi N.
;
Omeirat G.
;
Chehab A.
;
Kayssi A.
(
2011
)
Transient current and delay analysis for resistive-open defects in future 16 nm CMOS circuits
Fawaz M.
;
Kobrosli N.
;
Chkeir A.
;
Chehab A.
;
Kayssi A.
(
2010
)
Assessing testing techniques for resistive-open defects in nanometer CMOS adders
Fawaz A.
;
Jaber A.
;
Kassem A.
;
Chehab A.
;
Kayssi A.
(
2011
)
Evaluation of iDDT testing for CMOS domino circuits
Nazer A.
;
Chehab A.
;
Kayssi A.
;
Makki R.
(
2005
)
An improved method for iDDT testing in the presence of leakage and process variation
Chehab A.
;
Kayssi A.
;
Nazer A.
;
Makki R.
(
2004
)
Testing techniques for resistive-open defects in future CMOS technologies
Fawaz M.
;
Kobrosli N.
;
Chehab A.
;
Kayssi A.
(
2010
)
Transient current testing of dynamic CMOS circuits
Aaraj N.
;
Nazer A.
;
Chehab A.
;
Kayssi A.
(
LOS ALAMITOS
,
2004
)
Transient current testing of dynamic CMOS circuits in the presence of leakage and process variation
Chehab A.
;
Kayssi A.
;
Nazer A.
;
Aaraj N.
(
2004
)
Now showing items 1-10 of 11
1
2
Next Page
Sort Options:
Relevance
Title Asc
Title Desc
Issue Date Asc
Issue Date Desc
Results Per Page:
5
10
20
40
60
80
100
Browse
All of AUB ScholarWorks
Communities & Collections
By Issue Date
Authors
Titles
Subjects
This Community
By Issue Date
Authors
Titles
Subjects
My Account
Login
Discover
Author
Chehab A. (11)
Kayssi A. (11)
Nazer A. (4)
Aaraj N. (2)
Fawaz M. (2)
Kobrosli N. (2)
Makki R. (2)
Chkeir A. (1)
Fawaz A. (1)
Fawaz K. (1)
... View More
Subject
CMOS integrated circuits (11)
||| (11)
Defects (7)
Process Variation (5)
Testing (5)
Adders (4)
CMOS technology (3)
Computer simulation (3)
Delay tests (3)
Nanometer technology (3)
... View More
Date Issued
2004 (3)
2009 (2)
2010 (2)
2011 (2)
2005 (1)
2013 (1)
Has File(s)
No (11)