AUB ScholarWorks

Does principal component analysis improve cluster-based analysis?

Show simple item record

dc.contributor.author Farjo J.
dc.contributor.author Assi R.A.
dc.contributor.author Masri W.
dc.contributor.author Zaraket F.
dc.contributor.editor
dc.date 2013
dc.date.accessioned 2017-09-07T07:08:18Z
dc.date.available 2017-09-07T07:08:18Z
dc.date.issued 2013
dc.identifier 10.1109/ICSTW.2013.52
dc.identifier.isbn
dc.identifier.issn
dc.identifier.uri http://hdl.handle.net/10938/11852
dc.description.abstract Researchers in the dynamic program analysis field have extensively used cluster analysis to address various problems. Typically, the clustering techniques are applied onto execution profiles having high dimensionality (i.e., involving a large number of profiling elements), sometimes in the order of thousands or even hundreds of thousands. Our concern is that the high number of profiling elements might diminish the effectiveness of the clustering process, which led us to explore the use of dimensionality reduction techniques as a preprocessing step to clustering. Specifically, in this work, we used PCA (Principal Component Analysis) as a dimensionality reduction technique and investigated its impact on two cluster-based analysis techniques, one aiming at identifying coincidentally correct tests, and the other at test suite minimization. In other words, we tried to assess whether PCA improves cluster-based analysis. Our experimental results showed that the impact was positive on the first technique, but inconclusive on the second, which calls for further investigation in the future. © 2013 IEEE.
dc.format.extent
dc.format.extent Pages: (400-403)
dc.language English
dc.publisher LOS ALAMITOS
dc.relation.ispartof Publication Name: Proceedings - IEEE 6th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2013; Conference Title: IEEE 6th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2013; Conference Date: 18 March 2013 through 20 March 2013; Conference Location: Luxembourg; Publication Year: 2013; Pages: (400-403);
dc.relation.ispartofseries
dc.relation.uri
dc.source Scopus
dc.subject.other
dc.title Does principal component analysis improve cluster-based analysis?
dc.type Conference Paper
dc.contributor.affiliation Farjo, J., Department of Electrical and Computer Engineering, American University of Beirut, Beirut, Lebanon
dc.contributor.affiliation Assi, R.A., Department of Electrical and Computer Engineering, American University of Beirut, Beirut, Lebanon
dc.contributor.affiliation Masri, W., Department of Electrical and Computer Engineering, American University of Beirut, Beirut, Lebanon
dc.contributor.affiliation Zaraket, F., Department of Electrical and Computer Engineering, American University of Beirut, Beirut, Lebanon
dc.contributor.authorAddress Department of Electrical and Computer Engineering, American University of Beirut, Beirut, Lebanon
dc.contributor.authorCorporate University: American University of Beirut; Faculty: Faculty of Engineering and Architecture; Department: Electrical and Computer Engineering;
dc.contributor.authorDepartment Electrical and Computer Engineering
dc.contributor.authorDivision
dc.contributor.authorEmail jmf09@aub.edu.lb; ria21@aub.edu.lb; wm13@aub.edu.lb; fz11@aub.edu.lb
dc.contributor.faculty Faculty of Engineering and Architecture
dc.contributor.authorInitials Farjo, J
dc.contributor.authorInitials Abou Assi, R
dc.contributor.authorInitials Masri, W
dc.contributor.authorInitials Zaraket, F
dc.contributor.authorOrcidID
dc.contributor.authorReprintAddress Farjo, J (reprint author), Amer Univ Beirut, Dept Elect and Comp Engn, Beirut, Lebanon.
dc.contributor.authorResearcherID
dc.contributor.authorUniversity American University of Beirut
dc.description.cited Abou-Assi R., 2011, 1 INT WORKSH TEST DE; Ammann P., 2008, INTRO SOFTWARE TESTI; CATTELL RB, 1966, MULTIVAR BEHAV RES, V1, P245, DOI 10.1207-s15327906mbr0102_10; DICKINSON W, 2001, ICSE 2001, P339; Fodor I.K., 2002, SURVEY DIMENSION RED; Hatcher L, 1994, STEP BY STEP APPROAC; Hierons RM, 2006, ACM T SOFTW ENG METH, V15, P227, DOI 10.1145-1151695.1151696; Jones J., 2001, ICSE, P467; KAISER HF, 1960, EDUC PSYCHOL MEAS, V20, P141, DOI 10.1177-001316446002000116; LIBLIT B, 2003, P ACM SIGPLAN C PROG, V38, P141; Masri W., 2009, 7 INT WORKSH DYN AN; Masri W, 2008, EMPIR SOFTW ENG, V13, P369, DOI 10.1007-s10664-008-9071-y; Masri W, 2009, INFORM SOFTWARE TECH, V51, P385, DOI 10.1016-j.infsof.2008.05.008; Masri W, 2007, IEEE T SOFTWARE ENG, V33, P454, DOI 10.1109-TSE.2007.1020; Masri W, 2010, SOFTW TEST VERIF REL, V20, P121, DOI 10.1002-stvr.409; Masri W., 2009, INT WORKSH DEF LARG; Masri W., 2010, 3 INT C SOFTW TEST V; Masri W., 2012, REGR ICST 2012 MONTR; Masri W, 2011, J SYST SOFTWARE, V84, P1171, DOI 10.1016-j.jss.2011.02.007; Masri W., 2008, COMPUTERS SECURITY, V27; Reps T., 1997, 5 ACM SIGSOFT S FDN; Shlens Jonathon, 2009, TUTORIAL PRINCIPAL C; Smith L. I., 2002, TUTORIAL PRINCIPAL C; VOAS JM, 1992, IEEE T SOFTWARE ENG, V18, P717, DOI 10.1109-32.153381; Wang XM, 2009, PROC INT CONF SOFTW, P45
dc.description.citedCount
dc.description.citedTotWOSCount 0
dc.description.citedWOSCount 0
dc.format.extentCount 4
dc.identifier.articleNo 6571659
dc.identifier.coden
dc.identifier.pubmedID
dc.identifier.scopusID 84883320887
dc.identifier.url
dc.publisher.address 10662 LOS VAQUEROS CIRCLE, PO BOX 3014, LOS ALAMITOS, CA 90720-1264 USA
dc.relation.ispartofConference Conference Title: IEEE 6th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2013 : Conference Date: 18 March 2013 through 20 March 2013 , Conference Location: Luxembourg.
dc.relation.ispartofConferenceCode 99045
dc.relation.ispartofConferenceDate 18 March 2013 through 20 March 2013
dc.relation.ispartofConferenceHosting
dc.relation.ispartofConferenceLoc Luxembourg
dc.relation.ispartofConferenceSponsor
dc.relation.ispartofConferenceTitle IEEE 6th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2013
dc.relation.ispartofFundingAgency 0819987, NSF, National Science Foundation
dc.relation.ispartOfISOAbbr
dc.relation.ispartOfIssue
dc.relation.ispartOfPart
dc.relation.ispartofPubTitle Proceedings - IEEE 6th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2013
dc.relation.ispartofPubTitleAbbr Proc. - IEEE Int. Conf. Softw. Test., Verif. Validation Workshops, ICSTW
dc.relation.ispartOfSpecialIssue
dc.relation.ispartOfSuppl
dc.relation.ispartOfVolume
dc.source.ID WOS:000332185600061
dc.type.publication Series
dc.subject.otherAuthKeyword cluster analysis
dc.subject.otherAuthKeyword coincidental correctness
dc.subject.otherAuthKeyword dimensionality reduction
dc.subject.otherAuthKeyword PCA (Principal Component Analysis)
dc.subject.otherAuthKeyword test suite minimization
dc.subject.otherChemCAS
dc.subject.otherIndex Clustering techniques
dc.subject.otherIndex coincidental correctness
dc.subject.otherIndex Dimensionality reduction
dc.subject.otherIndex Dimensionality reduction techniques
dc.subject.otherIndex Dynamic program analysis
dc.subject.otherIndex PCA (principal component analysis)
dc.subject.otherIndex Pre-processing step
dc.subject.otherIndex Test suite minimization
dc.subject.otherIndex Cluster analysis
dc.subject.otherIndex Clustering algorithms
dc.subject.otherIndex Principal component analysis
dc.subject.otherIndex Software testing
dc.subject.otherIndex Reduction
dc.subject.otherKeywordPlus COINCIDENTAL CORRECTNESS
dc.subject.otherKeywordPlus FAULT LOCALIZATION
dc.subject.otherKeywordPlus COVERAGE
dc.subject.otherWOS Computer Science, Software Engineering
dc.subject.otherWOS Engineering, Electrical and Electronic


Files in this item

Files Size Format View

There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record

Search AUB ScholarWorks


Browse

My Account