dc.contributor.author |
Farjo J. |
dc.contributor.author |
Assi R.A. |
dc.contributor.author |
Masri W. |
dc.contributor.author |
Zaraket F. |
dc.contributor.editor |
|
dc.date |
2013 |
dc.date.accessioned |
2017-09-07T07:08:18Z |
dc.date.available |
2017-09-07T07:08:18Z |
dc.date.issued |
2013 |
dc.identifier |
10.1109/ICSTW.2013.52 |
dc.identifier.isbn |
|
dc.identifier.issn |
|
dc.identifier.uri |
http://hdl.handle.net/10938/11852 |
dc.description.abstract |
Researchers in the dynamic program analysis field have extensively used cluster analysis to address various problems. Typically, the clustering techniques are applied onto execution profiles having high dimensionality (i.e., involving a large number of profiling elements), sometimes in the order of thousands or even hundreds of thousands. Our concern is that the high number of profiling elements might diminish the effectiveness of the clustering process, which led us to explore the use of dimensionality reduction techniques as a preprocessing step to clustering. Specifically, in this work, we used PCA (Principal Component Analysis) as a dimensionality reduction technique and investigated its impact on two cluster-based analysis techniques, one aiming at identifying coincidentally correct tests, and the other at test suite minimization. In other words, we tried to assess whether PCA improves cluster-based analysis. Our experimental results showed that the impact was positive on the first technique, but inconclusive on the second, which calls for further investigation in the future. © 2013 IEEE. |
dc.format.extent |
|
dc.format.extent |
Pages: (400-403) |
dc.language |
English |
dc.publisher |
LOS ALAMITOS |
dc.relation.ispartof |
Publication Name: Proceedings - IEEE 6th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2013; Conference Title: IEEE 6th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2013; Conference Date: 18 March 2013 through 20 March 2013; Conference Location: Luxembourg; Publication Year: 2013; Pages: (400-403); |
dc.relation.ispartofseries |
|
dc.relation.uri |
|
dc.source |
Scopus |
dc.subject.other |
|
dc.title |
Does principal component analysis improve cluster-based analysis? |
dc.type |
Conference Paper |
dc.contributor.affiliation |
Farjo, J., Department of Electrical and Computer Engineering, American University of Beirut, Beirut, Lebanon |
dc.contributor.affiliation |
Assi, R.A., Department of Electrical and Computer Engineering, American University of Beirut, Beirut, Lebanon |
dc.contributor.affiliation |
Masri, W., Department of Electrical and Computer Engineering, American University of Beirut, Beirut, Lebanon |
dc.contributor.affiliation |
Zaraket, F., Department of Electrical and Computer Engineering, American University of Beirut, Beirut, Lebanon |
dc.contributor.authorAddress |
Department of Electrical and Computer Engineering, American University of Beirut, Beirut, Lebanon |
dc.contributor.authorCorporate |
University: American University of Beirut; Faculty: Faculty of Engineering and Architecture; Department: Electrical and Computer Engineering; |
dc.contributor.authorDepartment |
Electrical and Computer Engineering |
dc.contributor.authorDivision |
|
dc.contributor.authorEmail |
jmf09@aub.edu.lb; ria21@aub.edu.lb; wm13@aub.edu.lb; fz11@aub.edu.lb |
dc.contributor.faculty |
Faculty of Engineering and Architecture |
dc.contributor.authorInitials |
Farjo, J |
dc.contributor.authorInitials |
Abou Assi, R |
dc.contributor.authorInitials |
Masri, W |
dc.contributor.authorInitials |
Zaraket, F |
dc.contributor.authorOrcidID |
|
dc.contributor.authorReprintAddress |
Farjo, J (reprint author), Amer Univ Beirut, Dept Elect and Comp Engn, Beirut, Lebanon. |
dc.contributor.authorResearcherID |
|
dc.contributor.authorUniversity |
American University of Beirut |
dc.description.cited |
Abou-Assi R., 2011, 1 INT WORKSH TEST DE; Ammann P., 2008, INTRO SOFTWARE TESTI; CATTELL RB, 1966, MULTIVAR BEHAV RES, V1, P245, DOI 10.1207-s15327906mbr0102_10; DICKINSON W, 2001, ICSE 2001, P339; Fodor I.K., 2002, SURVEY DIMENSION RED; Hatcher L, 1994, STEP BY STEP APPROAC; Hierons RM, 2006, ACM T SOFTW ENG METH, V15, P227, DOI 10.1145-1151695.1151696; Jones J., 2001, ICSE, P467; KAISER HF, 1960, EDUC PSYCHOL MEAS, V20, P141, DOI 10.1177-001316446002000116; LIBLIT B, 2003, P ACM SIGPLAN C PROG, V38, P141; Masri W., 2009, 7 INT WORKSH DYN AN; Masri W, 2008, EMPIR SOFTW ENG, V13, P369, DOI 10.1007-s10664-008-9071-y; Masri W, 2009, INFORM SOFTWARE TECH, V51, P385, DOI 10.1016-j.infsof.2008.05.008; Masri W, 2007, IEEE T SOFTWARE ENG, V33, P454, DOI 10.1109-TSE.2007.1020; Masri W, 2010, SOFTW TEST VERIF REL, V20, P121, DOI 10.1002-stvr.409; Masri W., 2009, INT WORKSH DEF LARG; Masri W., 2010, 3 INT C SOFTW TEST V; Masri W., 2012, REGR ICST 2012 MONTR; Masri W, 2011, J SYST SOFTWARE, V84, P1171, DOI 10.1016-j.jss.2011.02.007; Masri W., 2008, COMPUTERS SECURITY, V27; Reps T., 1997, 5 ACM SIGSOFT S FDN; Shlens Jonathon, 2009, TUTORIAL PRINCIPAL C; Smith L. I., 2002, TUTORIAL PRINCIPAL C; VOAS JM, 1992, IEEE T SOFTWARE ENG, V18, P717, DOI 10.1109-32.153381; Wang XM, 2009, PROC INT CONF SOFTW, P45 |
dc.description.citedCount |
|
dc.description.citedTotWOSCount |
0 |
dc.description.citedWOSCount |
0 |
dc.format.extentCount |
4 |
dc.identifier.articleNo |
6571659 |
dc.identifier.coden |
|
dc.identifier.pubmedID |
|
dc.identifier.scopusID |
84883320887 |
dc.identifier.url |
|
dc.publisher.address |
10662 LOS VAQUEROS CIRCLE, PO BOX 3014, LOS ALAMITOS, CA 90720-1264 USA |
dc.relation.ispartofConference |
Conference Title: IEEE 6th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2013 : Conference Date: 18 March 2013 through 20 March 2013 , Conference Location: Luxembourg. |
dc.relation.ispartofConferenceCode |
99045 |
dc.relation.ispartofConferenceDate |
18 March 2013 through 20 March 2013 |
dc.relation.ispartofConferenceHosting |
|
dc.relation.ispartofConferenceLoc |
Luxembourg |
dc.relation.ispartofConferenceSponsor |
|
dc.relation.ispartofConferenceTitle |
IEEE 6th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2013 |
dc.relation.ispartofFundingAgency |
0819987, NSF, National Science Foundation |
dc.relation.ispartOfISOAbbr |
|
dc.relation.ispartOfIssue |
|
dc.relation.ispartOfPart |
|
dc.relation.ispartofPubTitle |
Proceedings - IEEE 6th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2013 |
dc.relation.ispartofPubTitleAbbr |
Proc. - IEEE Int. Conf. Softw. Test., Verif. Validation Workshops, ICSTW |
dc.relation.ispartOfSpecialIssue |
|
dc.relation.ispartOfSuppl |
|
dc.relation.ispartOfVolume |
|
dc.source.ID |
WOS:000332185600061 |
dc.type.publication |
Series |
dc.subject.otherAuthKeyword |
cluster analysis |
dc.subject.otherAuthKeyword |
coincidental correctness |
dc.subject.otherAuthKeyword |
dimensionality reduction |
dc.subject.otherAuthKeyword |
PCA (Principal Component Analysis) |
dc.subject.otherAuthKeyword |
test suite minimization |
dc.subject.otherChemCAS |
|
dc.subject.otherIndex |
Clustering techniques |
dc.subject.otherIndex |
coincidental correctness |
dc.subject.otherIndex |
Dimensionality reduction |
dc.subject.otherIndex |
Dimensionality reduction techniques |
dc.subject.otherIndex |
Dynamic program analysis |
dc.subject.otherIndex |
PCA (principal component analysis) |
dc.subject.otherIndex |
Pre-processing step |
dc.subject.otherIndex |
Test suite minimization |
dc.subject.otherIndex |
Cluster analysis |
dc.subject.otherIndex |
Clustering algorithms |
dc.subject.otherIndex |
Principal component analysis |
dc.subject.otherIndex |
Software testing |
dc.subject.otherIndex |
Reduction |
dc.subject.otherKeywordPlus |
COINCIDENTAL CORRECTNESS |
dc.subject.otherKeywordPlus |
FAULT LOCALIZATION |
dc.subject.otherKeywordPlus |
COVERAGE |
dc.subject.otherWOS |
Computer Science, Software Engineering |
dc.subject.otherWOS |
Engineering, Electrical and Electronic |