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Profiling of HEVC encoder

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dc.contributor.author Saab F.
dc.contributor.author Elhajj I.H.
dc.contributor.author Kayssi A.
dc.contributor.author Chehab A.
dc.contributor.editor
dc.date 2014
dc.date.accessioned 2017-09-07T07:08:29Z
dc.date.available 2017-09-07T07:08:29Z
dc.date.issued 2014
dc.identifier 10.1049/el.2014.1010
dc.identifier.isbn
dc.identifier.issn 00135194
dc.identifier.uri http://hdl.handle.net/10938/11975
dc.description.abstract One of the serious challenges facing smartphones and other portable devices nowadays is battery life. A typical smartphone user will be running several applications on the device at any given time, and most of these applications consume plenty of energy. In fact, some of the most energy-consuming applications are those related to video conferencing and streaming. There is a lot of work to improve the energy efficiency of such applications by improving the energy efficiency of the underlying encoders. However, to accomplish that, full profiling of the encoder must be performed first. The results of profiling the High Efficiency Video Coding (HEVC) are presented. Results are presented in terms of types of assembly level instructions in every function of the encoder. Thus, depending on the environment on which the encoder is running, the energy consumed for any type of instruction can be obtained. The results show that, in an HEVC encoding process, about 48percent of the instructions are memory related and about 18-20percent are arithmetic operations. This result is very important for any work in energy analysis and optimisation of the HEVC encoder © 2014 The Institution of Engineering and Technology.
dc.format.extent
dc.format.extent Pages: (1061-1063)
dc.language English
dc.publisher Institution of Engineering and Technology; HERTFORD
dc.relation.ispartof Publication Name: Electronics Letters; Publication Year: 2014; Volume: 50; no. 15; Pages: (1061-1063);
dc.relation.ispartofseries
dc.relation.uri
dc.source Scopus
dc.subject.other
dc.title Profiling of HEVC encoder
dc.type Article
dc.contributor.affiliation Saab, F., Electrical and Computer Engineering Department, American University of Beirut, Beirut, Lebanon
dc.contributor.affiliation Elhajj, I.H., Electrical and Computer Engineering Department, American University of Beirut, Beirut, Lebanon
dc.contributor.affiliation Kayssi, A., Electrical and Computer Engineering Department, American University of Beirut, Beirut, Lebanon
dc.contributor.affiliation Chehab, A., Electrical and Computer Engineering Department, American University of Beirut, Beirut, Lebanon
dc.contributor.authorAddress
dc.contributor.authorCorporate University: American University of Beirut; Faculty: Faculty of Engineering and Architecture; Department: Electrical and Computer Engineering;
dc.contributor.authorDepartment Electrical and Computer Engineering
dc.contributor.authorDivision
dc.contributor.authorEmail fws02@mail.aub.edu
dc.contributor.authorFaculty Faculty of Engineering and Architecture
dc.contributor.authorInitials Saab, F
dc.contributor.authorInitials Elhajj, IH
dc.contributor.authorInitials Kayssi, A
dc.contributor.authorInitials Chehab, A
dc.contributor.authorOrcidID
dc.contributor.authorReprintAddress Saab, F (reprint author), Amer Univ Beirut, Elect and Comp Engn Dept, Beirut, Lebanon.
dc.contributor.authorResearcherID
dc.contributor.authorUniversity American University of Beirut
dc.description.cited Kurdahi FJ, 2010, IEEE T VLSI SYST, V18, P852, DOI 10.1109-TVLSI.2009.2016665; Mammeri A., 2008, MCSEAI C OR ALG APR, P639; Mammeri A., 2008, P COMP COMM NETW ICC, P1; Ohm J.-R., 2012, IEEE T CIRCUITS SYST, V22, P1668; Saab F., 2013, INT C EN AW COMP IST, P152; Sullivan G.J., 2012, IEEE T CIRCUITS SYST, V22, P1648, DOI DOI 10.1109-TCSVT.2012.2221191
dc.description.citedCount
dc.description.citedTotWOSCount 0
dc.description.citedWOSCount 0
dc.format.extentCount 3
dc.identifier.articleNo
dc.identifier.coden ELLEA
dc.identifier.pubmedID
dc.identifier.scopusID 84904345303
dc.identifier.url
dc.publisher.address MICHAEL FARADAY HOUSE SIX HILLS WAY STEVENAGE, HERTFORD SG1 2AY, ENGLAND
dc.relation.ispartofConference
dc.relation.ispartofConferenceCode
dc.relation.ispartofConferenceDate
dc.relation.ispartofConferenceHosting
dc.relation.ispartofConferenceLoc
dc.relation.ispartofConferenceSponsor
dc.relation.ispartofConferenceTitle
dc.relation.ispartofFundingAgency
dc.relation.ispartOfISOAbbr Electron. Lett.
dc.relation.ispartOfIssue 15
dc.relation.ispartOfPart
dc.relation.ispartofPubTitle Electronics Letters
dc.relation.ispartofPubTitleAbbr Electron. Lett.
dc.relation.ispartOfSpecialIssue
dc.relation.ispartOfSuppl
dc.relation.ispartOfVolume 50
dc.source.ID WOS:000340242300017
dc.type.publication Journal
dc.subject.otherAuthKeyword
dc.subject.otherChemCAS
dc.subject.otherIndex Energy efficiency
dc.subject.otherIndex Video conferencing
dc.subject.otherIndex Arithmetic operations
dc.subject.otherIndex Assembly levels
dc.subject.otherIndex Battery life
dc.subject.otherIndex Encoding process
dc.subject.otherIndex Energy analysis
dc.subject.otherIndex High-efficiency video coding
dc.subject.otherIndex Optimisations
dc.subject.otherIndex Portable device
dc.subject.otherIndex Smartphones
dc.subject.otherKeywordPlus
dc.subject.otherWOS Engineering, Electrical and Electronic


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