Abstract:
We present a scaling methodology to improve i DDT fault coverage in random logic circuits. The study targets two i DDT test methods: Double Threshold i DDT and Delayed i DDT. The effectiveness of the scaling methodology is assessed through physical test measurements, and studied relative to process variation and impact on circuit performance. The scaling is made possible using a clustering methodology that can significantly improve fault coverage. The results show that without clustering, the effectiveness of the i DDT testing methods considered is greatly reduced as the circuit size increases. © 2006 Springer Science + Business Media, Inc.