Design Exploration of Sensing Techniques in 2T-2R Resistive Ternary CAMs

dc.contributor.authorRakka, Mariam
dc.contributor.authorFouda, Mohammed E.
dc.contributor.authorKanj, Rouwaida N.
dc.contributor.authorEltawil, Ahmed M.
dc.contributor.authorKurdahi, Fadi J.
dc.contributor.departmentDepartment of Electrical and Computer Engineering
dc.contributor.facultyMaroun Semaan Faculty of Engineering and Architecture (MSFEA)
dc.contributor.institutionAmerican University of Beirut
dc.date.accessioned2025-01-24T11:30:31Z
dc.date.available2025-01-24T11:30:31Z
dc.date.issued2021
dc.description.abstractIn-Memory Computing (IMC) is considered a great candidate to replace von-Neumann computing architecture to overcome the memory wall. Ternary content-addressable memories are the main building blocks in IMC-based architectures, such as the associative processors. In this brief, we present a juxtaposition between the capacitive and resistive sensing in 2T-2R TCAMs. A Figure of Merit, function of the dynamic range, latency, and energy, is defined to have a fair comparison between the two sensing techniques. A mathematical model for the transient behavior of both sensing schemes has been derived and verified through SPICE simulations. We studied the performance with an in-memory addition application. Results from various scenarios show that the resistive sensing outperforms the capacitive one in both theoretical and application-based contexts. © 2004-2012 IEEE.
dc.identifier.doihttps://doi.org/10.1109/TCSII.2020.3017477
dc.identifier.eid2-s2.0-85100235057
dc.identifier.urihttp://hdl.handle.net/10938/27445
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers Inc.
dc.relation.ispartofIEEE Transactions on Circuits and Systems II: Express Briefs
dc.sourceScopus
dc.subject2t-2r tcam
dc.subjectAnalysis
dc.subjectAssociative processors
dc.subjectIn-memory computing
dc.subjectMathematical model
dc.subjectAssociative storage
dc.subjectMemory architecture
dc.subjectBuilding blockes
dc.subjectDesign exploration
dc.subjectFigure of merits
dc.subjectNeumann computing
dc.subjectSensing techniques
dc.subjectSpice simulations
dc.subjectTernary content addressable memory
dc.subjectTransient behavior
dc.subjectTernary content adressable memory
dc.titleDesign Exploration of Sensing Techniques in 2T-2R Resistive Ternary CAMs
dc.typeArticle

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