Development of photothermal imaging technique

dc.contributor.authorEl-Zghir, Rawan Khalil
dc.contributor.departmentDepartment of Physics
dc.contributor.facultyFaculty of Arts and Sciences.
dc.contributor.institutionAmerican University of Beirut.
dc.date2019
dc.date.accessioned2021-09-23T08:57:05Z
dc.date.available2021-09-23T08:57:05Z
dc.date.issued2019
dc.date.submitted2019
dc.descriptionThesis. M.S. American University of Beirut. Department of Physics, 2019. T:7094.
dc.descriptionAdvisor : Dr. Michel Kazan, Associate Professor, Physics ; Members of Committee : Dr. Malek Tabbal, Professor, Physics ; Dr. Samih Isber, Professor, Physics.
dc.descriptionIncludes bibliographical references (leaves 55-56)
dc.description.abstractWhen an infrared laser beam is absorbed by the sample, a part or all of the light energy is converted into heat. If the exciting laser beam intensity is modulated, the heat is generated repeatedly at the modulation frequency. The absorption of optical energy leads to the generation and propagation of energy-carrying thermal waves as well as energy-carrying elastic waves. It therefore, appears that thermal and elastic waves based subsurface images can be recorded. In this thesis, we have developed an infrared optical technique that takes advantage of these rapidly damped waves to image structures beneath the surface of the measured sample inaccessible by conventional microscopy techniques. We have tested the developed technique on silicon carbide substrates irradiated with fluxes of H+ ions of different doses. The energy with which these ions were sent allows creating damages at a depth of approximately 60 microns beneath the surface. The developed technique was able to detect these subsurface defects with high precision. Furthermore, we were able to study the thermal transports in intact and bombarded regions using the same technique. We found that the damages created by ion-bombardment cause an important thermal resistance in the volume of the sample, which forces the heat flux to remain localized in the surface layers of the sample.
dc.format.extent1 online resource (x, 56 leaves) : illustrations (some color)
dc.identifier.otherb25782381
dc.identifier.urihttp://hdl.handle.net/10938/23125
dc.language.isoen
dc.subject.classificationT:007094
dc.subject.lcshPhotothermal spectroscopy.
dc.subject.lcshThermoelastic stress analysis.
dc.subject.lcshThermal properties.
dc.titleDevelopment of photothermal imaging technique
dc.typeThesis

Files

Original bundle

Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
t-7094.pdf
Size:
3.47 MB
Format:
Adobe Portable Document Format