A lightweight write-assist scheme for reduced RRAM variability and power

dc.contributor.authorAziza, Hassen
dc.contributor.authorHajri, Basma
dc.contributor.authorMansour, Mohammad M.
dc.contributor.authorChehab, Ali
dc.contributor.authorṔerez, Annie
dc.contributor.departmentDepartment of Electrical and Computer Engineering
dc.contributor.facultyMaroun Semaan Faculty of Engineering and Architecture (MSFEA)
dc.contributor.institutionAmerican University of Beirut
dc.date.accessioned2025-01-24T11:29:31Z
dc.date.available2025-01-24T11:29:31Z
dc.date.issued2018
dc.description.abstractCommon problems with Oxide-based Resistive RAM are related to high variability in operating conditions and high programming currents during FORMING, SET and RESET operations. Although research has taken steps to resolve these issues, variability combined with high programming currents remains an important characteristic for RRAMs. In a conventional write scheme with fixed duration and amplitude, the programming current is not controlled, which degrades the cell performance (power consumption and variability) due to over-programming. In this paper, a self-adaptive write driver is proposed to control the write current. A feedback mechanism based on current comparison is used to switch off the write stimulus as soon as the preferred write current is reached. Compared to conventional write schemes, in the proposed write-assist circuit, the write energy per bit is reduced by 27% and the standard deviation of post-FORMING distributions is reduced by 57%. © 2018 Elsevier Ltd
dc.identifier.doihttps://doi.org/10.1016/j.microrel.2018.07.065
dc.identifier.eid2-s2.0-85054873819
dc.identifier.urihttp://hdl.handle.net/10938/27246
dc.language.isoen
dc.publisherElsevier Ltd
dc.relation.ispartofMicroelectronics Reliability
dc.sourceScopus
dc.subjectMagnetic materials
dc.subjectMicroelectronics
dc.subjectCell performance
dc.subjectEnergy-per-bit
dc.subjectFeedback mechanisms
dc.subjectOperating condition
dc.subjectProgramming currents
dc.subjectSelf-adaptive
dc.subjectStandard deviation
dc.subjectWrite currents
dc.subjectRram
dc.titleA lightweight write-assist scheme for reduced RRAM variability and power
dc.typeArticle

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