DRV computing circuit : a novel technique to measure the data retention voltage of large SRAM arrays - by Farah Bassam Yahya.

dc.contributor.author	Yahya, Farah Bassam.
dc.contributor.department	Department of Electrical and Computer Engineering
dc.contributor.faculty	Faculty of Engineering and Architecture
dc.contributor.institution	American University of Beirut
dc.date	2011
dc.date.accessioned	2012-06-13T07:35:38Z
dc.date.available	2012-06-13T07:35:38Z
dc.date.issued	2011
dc.description	Thesis (M.E.)--American University of Beirut, Department of Electrical and Computer Engineering, 2011.;"Advisor : Dr. Mohammad Mansour, Associate Professor, Department of Electrical and Computer Engineering--Members of Committee : Dr. Ayman Kayssi, Profes
dc.description	Includes bibliographical references (leaves 109-111)
dc.description.abstract	In modern microprocessors, memory occupies the largest area on chip and accounts for the most power consumption. This trend is bound to increase as transistor sizes continue to scale down with every technology node, raising concerns about increased power
dc.format.extent	xiii, 111 leaves : ill. 30 cm.
dc.identifier.uri	http://hdl.handle.net/10938/8692
dc.language.iso	en
dc.relation.ispartof	Theses, Dissertations, and Projects
dc.subject.classification	ET:005563 AUBNO
dc.subject.lcsh	Integrated circuits -- Reliability.
dc.subject.lcsh	Digital integrated circuits.
dc.subject.lcsh	Low voltage integrated circuits.
dc.title	DRV computing circuit : a novel technique to measure the data retention voltage of large SRAM arrays - by Farah Bassam Yahya.
dc.type	Thesis

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