Evaluation of dynamic current testing for CMOS domino circuits - by Anis Musa Nazer
Abstract
Transient current (iDDT) refers to the current drawn from the power supply durin g the transient switching of CMOS gates. Testing based on the transient current can detect many of the defects that can occur in ICs, such as resistive opens, w hich may not
Description
Thesis (M.E.)--American University of Beirut, Department of Electrical and Computer Engineering, 2005.;"Advisor: Dr. Ali Chehab, Assistant Professor, Electrical and Computer Engineering--Member of Committee: Dr. Ayman Kayssi, Professor, Electrical and Com
Bibliography: leaves 88-93.
Bibliography: leaves 88-93.