Evaluation of dynamic current testing for CMOS domino circuits - by Anis Musa Nazer

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dc.contributor.authorNazer, Anis Musa
dc.contributor.departmentAmerican University of Beirut. Faculty of Engineering and Architecture. Department of Electrical and Computer Engineering
dc.date2005
dc.date.accessioned2012-06-13T07:09:18Z
dc.date.available2012-06-13T07:09:18Z
dc.date.issued2005
dc.descriptionThesis (M.E.)--American University of Beirut, Department of Electrical and Computer Engineering, 2005.;"Advisor: Dr. Ali Chehab, Assistant Professor, Electrical and Computer Engineering--Member of Committee: Dr. Ayman Kayssi, Professor, Electrical and Com
dc.descriptionBibliography: leaves 88-93.
dc.description.abstractTransient current (iDDT) refers to the current drawn from the power supply durin g the transient switching of CMOS gates. Testing based on the transient current can detect many of the defects that can occur in ICs, such as resistive opens, w hich may not
dc.format.extentxiii, 93 leaves : ill. 30 cm.
dc.identifier.urihttp://hdl.handle.net/10938/7041
dc.language.isoen
dc.relation.ispartofTheses, Dissertations, and Projects
dc.subject.classificationET:004688 AUBNO
dc.subject.lcshMetal oxide semiconductors, Complementary
dc.titleEvaluation of dynamic current testing for CMOS domino circuits - by Anis Musa Nazer
dc.typeThesis

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