Optical emission spectroscopy of oxygen microwave plasma for oxide thin film growth application - by Diala Ali Haidar Ahmad

dc.contributor.authorHaidar Ahmad, Diala Ali
dc.contributor.departmentAmerican University of Beirut. Faculty of Arts and Sciences. Department of Physics
dc.date2008
dc.date.accessioned2012-06-13T07:11:17Z
dc.date.available2012-06-13T07:11:17Z
dc.date.issued2008
dc.descriptionThesis (M.S.)--American University of Beirut, Dept. of Physics, 2008.;"Advisor : Dr. Malek Tabbal, Professor , Physics--Member of Committee : Dr. Mazen Al-Ghoul, Associate Professor ,Chemistry--Member of Committee : Prof.. Mounib El Eid, Professor, Physic
dc.descriptionBibliography : leaves 68-70.
dc.description.abstractThe aim of this thesis was to characterize the oxygen plasma generated by a 2.45 GHz microwave source that is being used for oxide thin film growth. The analysi s was conducted by optical emission spectroscopy in order to measure the product ion of dissoc
dc.format.extentxii, 70 leaves : ill. (some col.) 30 cm.
dc.identifier.urihttp://hdl.handle.net/10938/7650
dc.language.isoen
dc.relation.ispartofTheses, Dissertations, and Projects
dc.subject.classificationT:005119 AUBNO
dc.subject.lcshPlasma (Ionized gases)
dc.subject.lcshSpectroscopy
dc.subject.lcshThin films
dc.titleOptical emission spectroscopy of oxygen microwave plasma for oxide thin film growth application - by Diala Ali Haidar Ahmad
dc.typeThesis

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