Aaraj N.; Nazer A.; Chehab A.; Kayssi A.
(LOS ALAMITOS10662 LOS VAQUEROS CIRCLE, PO BOX 3014, LOS ALAMITOS, CA 90720-1264 USA, 2004)
We propose methods for testing dynamic CMOS circuits using the transient power supply current, iDDT. The methods are based on setting the primary inputs of the circuit under test, switching the clock signal and monitoring ...