Qamhieh N.; Mahmoud S.T.; Ayesh A.I.; Ghamlouche H.
(WEINHEIMBOSCHSTRASSE 12, D-69469 WEINHEIM, GERMANY, 2012)
The capacitance variation as a function of temperature and electric field for tellurium free Ge15Sb85 thin films deposited by the DC sputtering technique is investigated. The capacitance measurements were performed for a ...