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Development of photothermal imaging technique

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dc.contributor.author El-Zghir, Rawan Khalil
dc.date.accessioned 2021-09-23T08:57:05Z
dc.date.available 2021-09-23T08:57:05Z
dc.date.issued 2019
dc.date.submitted 2019
dc.identifier.other b25782381
dc.identifier.uri http://hdl.handle.net/10938/23125
dc.description Thesis. M.S. American University of Beirut. Department of Physics, 2019. T:7094.
dc.description Advisor : Dr. Michel Kazan, Associate Professor, Physics ; Members of Committee : Dr. Malek Tabbal, Professor, Physics ; Dr. Samih Isber, Professor, Physics.
dc.description Includes bibliographical references (leaves 55-56)
dc.description.abstract When an infrared laser beam is absorbed by the sample, a part or all of the light energy is converted into heat. If the exciting laser beam intensity is modulated, the heat is generated repeatedly at the modulation frequency. The absorption of optical energy leads to the generation and propagation of energy-carrying thermal waves as well as energy-carrying elastic waves. It therefore, appears that thermal and elastic waves based subsurface images can be recorded. In this thesis, we have developed an infrared optical technique that takes advantage of these rapidly damped waves to image structures beneath the surface of the measured sample inaccessible by conventional microscopy techniques. We have tested the developed technique on silicon carbide substrates irradiated with fluxes of H+ ions of different doses. The energy with which these ions were sent allows creating damages at a depth of approximately 60 microns beneath the surface. The developed technique was able to detect these subsurface defects with high precision. Furthermore, we were able to study the thermal transports in intact and bombarded regions using the same technique. We found that the damages created by ion-bombardment cause an important thermal resistance in the volume of the sample, which forces the heat flux to remain localized in the surface layers of the sample.
dc.format.extent 1 online resource (x, 56 leaves) : illustrations (some color)
dc.language.iso en
dc.subject.classification T:007094
dc.subject.lcsh Photothermal spectroscopy.
dc.subject.lcsh Thermoelastic stress analysis.
dc.subject.lcsh Thermal properties.
dc.title Development of photothermal imaging technique
dc.type Thesis
dc.contributor.department Department of Physics
dc.contributor.faculty Faculty of Arts and Sciences.
dc.contributor.institution American University of Beirut.


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