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Evaluation of dynamic current testing for CMOS domino circuits - by Anis Musa Nazer
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| dc.contributor.author | Nazer, Anis Musa |
| dc.date.accessioned | 2012-06-13T07:09:18Z |
| dc.date.available | 2012-06-13T07:09:18Z |
| dc.date.issued | 2005 |
| dc.identifier.uri | http://hdl.handle.net/10938/7041 |
| dc.description | Thesis (M.E.)--American University of Beirut, Department of Electrical and Computer Engineering, 2005.;"Advisor: Dr. Ali Chehab, Assistant Professor, Electrical and Computer Engineering--Member of Committee: Dr. Ayman Kayssi, Professor, Electrical and Com |
| dc.description | Bibliography: leaves 88-93. |
| dc.description.abstract | Transient current (iDDT) refers to the current drawn from the power supply durin g the transient switching of CMOS gates. Testing based on the transient current can detect many of the defects that can occur in ICs, such as resistive opens, w hich may not |
| dc.format.extent | xiii, 93 leaves : ill. 30 cm. |
| dc.language.iso | eng |
| dc.relation.ispartof | Theses, Dissertations, and Projects |
| dc.subject.classification | ET:004688 AUBNO |
| dc.subject.lcsh | Metal oxide semiconductors, Complementary |
| dc.title | Evaluation of dynamic current testing for CMOS domino circuits - by Anis Musa Nazer |
| dc.type | Thesis |
| dc.contributor.department | American University of Beirut. Faculty of Engineering and Architecture. Department of Electrical and Computer Engineering |
