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Optical emission spectroscopy of oxygen microwave plasma for oxide thin film growth application - by Diala Ali Haidar Ahmad

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dc.contributor.author Haidar Ahmad, Diala Ali
dc.date.accessioned 2012-06-13T07:11:17Z
dc.date.available 2012-06-13T07:11:17Z
dc.date.issued 2008
dc.identifier.uri http://hdl.handle.net/10938/7650
dc.description Thesis (M.S.)--American University of Beirut, Dept. of Physics, 2008.;"Advisor : Dr. Malek Tabbal, Professor , Physics--Member of Committee : Dr. Mazen Al-Ghoul, Associate Professor ,Chemistry--Member of Committee : Prof.. Mounib El Eid, Professor, Physic
dc.description Bibliography : leaves 68-70.
dc.description.abstract The aim of this thesis was to characterize the oxygen plasma generated by a 2.45 GHz microwave source that is being used for oxide thin film growth. The analysi s was conducted by optical emission spectroscopy in order to measure the product ion of dissoc
dc.format.extent xii, 70 leaves : ill. (some col.) 30 cm.
dc.language.iso eng
dc.relation.ispartof Theses, Dissertations, and Projects
dc.subject.classification T:005119 AUBNO
dc.subject.lcsh Plasma (Ionized gases)
dc.subject.lcsh Spectroscopy
dc.subject.lcsh Thin films
dc.title Optical emission spectroscopy of oxygen microwave plasma for oxide thin film growth application - by Diala Ali Haidar Ahmad
dc.type Thesis
dc.contributor.department American University of Beirut. Faculty of Arts and Sciences. Department of Physics


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