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DRV computing circuit : a novel technique to measure the data retention voltage of large SRAM arrays - by Farah Bassam Yahya.
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| dc.contributor.author | Yahya, Farah Bassam. |
| dc.date.accessioned | 2012-06-13T07:35:38Z |
| dc.date.available | 2012-06-13T07:35:38Z |
| dc.date.issued | 2011 |
| dc.identifier.uri | http://hdl.handle.net/10938/8692 |
| dc.description | Thesis (M.E.)--American University of Beirut, Department of Electrical and Computer Engineering, 2011.;"Advisor : Dr. Mohammad Mansour, Associate Professor, Department of Electrical and Computer Engineering--Members of Committee : Dr. Ayman Kayssi, Profes |
| dc.description | Includes bibliographical references (leaves 109-111) |
| dc.description.abstract | In modern microprocessors, memory occupies the largest area on chip and accounts for the most power consumption. This trend is bound to increase as transistor sizes continue to scale down with every technology node, raising concerns about increased power |
| dc.format.extent | xiii, 111 leaves : ill. 30 cm. |
| dc.language.iso | eng |
| dc.relation.ispartof | Theses, Dissertations, and Projects |
| dc.subject.classification | ET:005563 AUBNO |
| dc.subject.lcsh | Integrated circuits -- Reliability. |
| dc.subject.lcsh | Digital integrated circuits. |
| dc.subject.lcsh | Low voltage integrated circuits. |
| dc.title | DRV computing circuit : a novel technique to measure the data retention voltage of large SRAM arrays - by Farah Bassam Yahya. |
| dc.type | Thesis |
| dc.contributor.department | American University of Beirut. Faculty of Engineering and Architecture. Department of Electrical and Computer Engineering. |
